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Static Test Compaction for VLSI Tests An Evolutionary ApproachLOGOFATU, D. |
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Author keywords
evolutionary algorithms, digital circuit design, test compaction problem, set coverage problem, test generation, greedy algorithm, optimization, don't care value
References keywords
algorithms(11), drechsler(6), test(5), logofatu(5), genetic(5), vlsi(4), systems(4), problems(4), design(4), data(4)
Blue keywords are present in both the references section and the paper title.
About this article
Date of Publication: 2008-06-02
Volume 8, Issue 2, Year 2008, On page(s): 49 - 53
ISSN: 1582-7445, e-ISSN: 1844-7600
Digital Object Identifier: 10.4316/AECE.2008.02009
Web of Science Accession Number: 000264815000009
SCOPUS ID: 77955593111
Abstract
The test compaction is one of most important requirement regarding the large scale integration (LSI) testing. The overall cost of a VLSI circuit's testing depends on the length of its test sequence; therefore the reduction of this sequence, keeping the coverage of error prone points, will lead to a reduction of used resources in the testing process. This problem is NP-complete. Consequently an optimal algorithm doesn't have applicability in practice. In this paper we describe an evolutionary algorithm (GATC) and we introduce the term of compaction factor (cf), i.e. the expected percentage of compacted test sequence. GATC provides in praxis better results than a greedy approach (GR) for many configurations. This improvement comes from the freedom to merge randomly pairs of compatible tests for different candidates to solution and keeps the ones with more Don't care positions, thus there is an increased probability to find for them compatible tests in the next stage. Also the C++ implementation was optimized, using compact data structures and the Standard Template Library. |
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[CrossRef] [Web of Science Times Cited 123] [SCOPUS Times Cited 154] Web of Science® Citations for all references: 3,047 TCR SCOPUS® Citations for all references: 4,004 TCR Web of Science® Average Citations per reference: 113 ACR SCOPUS® Average Citations per reference: 148 ACR TCR = Total Citations for References / ACR = Average Citations per Reference We introduced in 2010 - for the first time in scientific publishing, the term "References Weight", as a quantitative indication of the quality ... Read more Citations for references updated on 2024-12-01 10:16 in 65 seconds. Note1: Web of Science® is a registered trademark of Clarivate Analytics. Note2: SCOPUS® is a registered trademark of Elsevier B.V. Disclaimer: All queries to the respective databases were made by using the DOI record of every reference (where available). Due to technical problems beyond our control, the information is not always accurate. Please use the CrossRef link to visit the respective publisher site. |
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Stefan cel Mare University of Suceava, Romania
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