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The Impact of the Load Side Parameters on PC Cluster's Harmonics EmissionKATIC, V. A.   , MUJOVIC, S. V. , RADULOVIC, V. M. , RADOVIC, J. S. |
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Author keywords
PC clusters, power conversion, harmonics
References keywords
power(17), harmonics(8), harmonic(8), transaction(7), phase(6), loads(6), delivery(6), single(5), effects(5), current(5)
Blue keywords are present in both the references section and the paper title.
About this article
Date of Publication: 2011-02-27
Volume 11, Issue 1, Year 2011, On page(s): 103 - 110
ISSN: 1582-7445, e-ISSN: 1844-7600
Digital Object Identifier: 10.4316/AECE.2011.01017
Web of Science Accession Number: 000288761800017
SCOPUS ID: 79955954061
Abstract
Harmonics current emission from personal computers (PCs) is of special interest to power quality researchers, due to their wide spread application and the fact that they are usually concentrated in large groups (clusters). The input current total harmonic distortion (THDI) dependence on number of connected PCs in a cluster (NPC) is affected by network parameters and load side parameters of each cluster's PC simultaneously. As the impact of grid parameters on the THDI=f(NPC) dependence is analyzed in the author's previous papers, special emphasis is given on the impact of the DC side smoothing capacitor (C) in PCs power supply unit. For engineering application it is convenient to present the THDI=f(NPC) function with simple mathematical expressions which include these effects. In the paper authors are proposing an improved mathematical expression to presents impact of load side (DC capacitance) parameters. To achieve this goal, results of the measurements of harmonic emission from a large computer center with 167 clustered PCs and the computer simulation for even larger number of PCs are used. |
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Web of Science® Citations for all references: 503 TCR SCOPUS® Citations for all references: 740 TCR Web of Science® Average Citations per reference: 23 ACR SCOPUS® Average Citations per reference: 34 ACR TCR = Total Citations for References / ACR = Average Citations per Reference We introduced in 2010 - for the first time in scientific publishing, the term "References Weight", as a quantitative indication of the quality ... Read more Citations for references updated on 2024-11-20 12:38 in 78 seconds. Note1: Web of Science® is a registered trademark of Clarivate Analytics. Note2: SCOPUS® is a registered trademark of Elsevier B.V. Disclaimer: All queries to the respective databases were made by using the DOI record of every reference (where available). Due to technical problems beyond our control, the information is not always accurate. Please use the CrossRef link to visit the respective publisher site. |
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Faculty of Electrical Engineering and Computer Science
Stefan cel Mare University of Suceava, Romania
All rights reserved: Advances in Electrical and Computer Engineering is a registered trademark of the Stefan cel Mare University of Suceava. No part of this publication may be reproduced, stored in a retrieval system, photocopied, recorded or archived, without the written permission from the Editor. When authors submit their papers for publication, they agree that the copyright for their article be transferred to the Faculty of Electrical Engineering and Computer Science, Stefan cel Mare University of Suceava, Romania, if and only if the articles are accepted for publication. The copyright covers the exclusive rights to reproduce and distribute the article, including reprints and translations.
Permission for other use: The copyright owner's consent does not extend to copying for general distribution, for promotion, for creating new works, or for resale. Specific written permission must be obtained from the Editor for such copying. Direct linking to files hosted on this website is strictly prohibited.
Disclaimer: Whilst every effort is made by the publishers and editorial board to see that no inaccurate or misleading data, opinions or statements appear in this journal, they wish to make it clear that all information and opinions formulated in the articles, as well as linguistic accuracy, are the sole responsibility of the author.
