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A Cell Sizing Technique for Mitigating Logic Soft Errors in Gate-level DesignsPARK, J. K.   , KIM, J. T. |
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Author keywords
single event transient, soft error, soft error mitigation, gate-level, gate sizing, cell sizing
References keywords
soft(16), error(15), design(9), circuits(6), combinational(5), analysis(5), systems(4), rate(4), logic(4), designs(4)
Blue keywords are present in both the references section and the paper title.
About this article
Date of Publication: 2013-11-30
Volume 13, Issue 4, Year 2013, On page(s): 13 - 18
ISSN: 1582-7445, e-ISSN: 1844-7600
Digital Object Identifier: 10.4316/AECE.2013.04003
Web of Science Accession Number: 000331461300003
SCOPUS ID: 84890160731
Abstract
The effect of logic soft errors on the degradation of the reliability becomes more crucial in the case of nano-meter semiconductor designs. Several hardening techniques have been reported from the transistor- to system-level. In order to suppress the single event transients originating from logic gates, this paper presents an improved heuristic search utilizing the gate-sizing technique. The algorithm re-orders the gate-traversal to maintain the reduced soft error rates of the preceding logic gates. The preferential candidates for the two successive algorithms are the logic gates near the primary outputs and flip-flops, rather than those of the higher portions of block soft error rate. The proposed technique reduces the logic soft error rate by more than 60% compared to the existing method in 45nm CMOS cell designs. |
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Faculty of Electrical Engineering and Computer Science
Stefan cel Mare University of Suceava, Romania
All rights reserved: Advances in Electrical and Computer Engineering is a registered trademark of the Stefan cel Mare University of Suceava. No part of this publication may be reproduced, stored in a retrieval system, photocopied, recorded or archived, without the written permission from the Editor. When authors submit their papers for publication, they agree that the copyright for their article be transferred to the Faculty of Electrical Engineering and Computer Science, Stefan cel Mare University of Suceava, Romania, if and only if the articles are accepted for publication. The copyright covers the exclusive rights to reproduce and distribute the article, including reprints and translations.
Permission for other use: The copyright owner's consent does not extend to copying for general distribution, for promotion, for creating new works, or for resale. Specific written permission must be obtained from the Editor for such copying. Direct linking to files hosted on this website is strictly prohibited.
Disclaimer: Whilst every effort is made by the publishers and editorial board to see that no inaccurate or misleading data, opinions or statements appear in this journal, they wish to make it clear that all information and opinions formulated in the articles, as well as linguistic accuracy, are the sole responsibility of the author.
