| 2/2019 - 5 |
Immunity Characterization of FPGA I/Os for Fault-Tolerant Circuit Designs against EMINGUYEN, V. T.   , DAM, M. T. , SO, J. , LEE, J.-G. |
Extra paper information in    |
| Click to see author's profile in SCOPUS, IEEE Xplore, Web of Science |
Download PDF  (1,484 KB) | Citation | Downloads: 974 | Views: 2,301 |
Author keywords
immunity, susceptibility, integrated circuit, electromagnetic compatibility, electromagnetic interference
References keywords
circuits(10), integrated(9), power(8), immunity(7), electromagnetic(7), temc(6), susceptibility(6), electro(6), compat(6), modeling(4)
Blue keywords are present in both the references section and the paper title.
About this article
Date of Publication: 2019-05-31
Volume 19, Issue 2, Year 2019, On page(s): 37 - 44
ISSN: 1582-7445, e-ISSN: 1844-7600
Digital Object Identifier: 10.4316/AECE.2019.02005
Web of Science Accession Number: 000475806300005
SCOPUS ID: 85066298408
Abstract
This paper characterizes the immunity of I/Os under different supply voltages for fault-tolerant circuit designs against electromagnetic interference. The direct power injection approach is used as a means to characterize the immunity of circuits. In this work, the immunity characterization has been performed under two scenarios: (1) an input buffer of a Field Programmable Gate Array (FPGA) followed by a single flip-flop, and (2) the FPGA input buffer followed by a redundancy-based fault-tolerant circuit. The experimental results show that when downscaling the supply voltage through a set of nominal values (i.e., 3.3, 2.5, 1.8, 1.5, 1.2 V), the immunity of I/Os is decreased from the highest level at 3.3 V to the lowest at 1.2 V. Particularly, the maximum difference in the immunity is about 16.8 dB at the frequency of 600 MHz. Moreover, experiments demonstrate that I/O buffers followed by the redundancy-based fault-tolerant circuit can improve the immunity of the circuit up to 4 dB below the frequency band of 400 MHz. Thus, the redundancy-based fault-tolerant circuit can support I/Os to operate reliably in the harsh environment. |
| References | | | Cited By «-- Click to see who has cited this paper |
| [1] Fr. Fiori, "Susceptibility of smart power ICs to radio frequency interference," IEEE Trans. Power Electron., vol. 29, no. 6, pp. 2787-2797, Jun. 2014. [CrossRef] [Web of Science Times Cited 10] [SCOPUS Times Cited 11] [2] A. Alaeldine, R. Perdriau, M. Ramdani, J.-L. Levant, and M. Drissi, "A Direct power injection model for immunity prediction in integrated circuits," IEEE Trans. Electromagn. Compat., vol. 50, no. 1, pp. 52-62, Feb. 2008. [CrossRef] [Web of Science Times Cited 51] [SCOPUS Times Cited 66] [3] T. Su, M. Unger, Th. Steinecke, and R. Weigel, "Using error-source switching (ESS) concept to analyze the conducted radio frequency electromagnetic immunity of microcontrollers," IEEE Trans. Electromagn. Compat., Vol. 54, No. 3, pp. 634-645, Jun. 2012. [CrossRef] [Web of Science Times Cited 7] [SCOPUS Times Cited 12] [4] M. Ramdani et al., "The Electromagnetic compatibility of integrated circuits-Past, Present, and Future," IEEE Trans. Electromagn. Compat., vol. 51, no. 1, pp. 78-100, 2009. [CrossRef] [Web of Science Times Cited 233] [SCOPUS Times Cited 301] [5] J. Wu et al., "Modeling and simulation of LDO voltage regulator susceptibility to conducted EMI," IEEE Trans. Electromagn. Compat., vol. 56, no. 3, pp. 726-735, Jun. 2014. [CrossRef] [Web of Science Times Cited 28] [SCOPUS Times Cited 38] [6] A. Ayed, Tr. Dubois, J.-L. Levant, and G. Duchamp, "A New method for the characterization of electronic components immunity," IEEE Trans. Instrum. Meas., vol. 64, no. 9, pp. 2496-2503, Sept. 2015. [CrossRef] [Web of Science Times Cited 5] [SCOPUS Times Cited 6] [7] M. Fontana, F. Canavero, and R. Perraud, "Integrated circuit modeling for noise susceptibility prediction in communication networks," IEEE Trans. Electromagn. Compat., vol. 57, no. 3, pp. 339-348, 2015. [CrossRef] [Web of Science Times Cited 13] [SCOPUS Times Cited 16] [8] R. Henderson, D. McMasters, D. French, and T. Clarke, "Direct power injection of microcontrollers in PCB environments," in Proc. of 2012 International Conference on Electromagnetics in Advanced Applications, Cape Town, 2012, pp. 1149-1151. [CrossRef] [SCOPUS Times Cited 4] [9] Ph. Schroter, Fr. Klotz, and M. Pamato, "RF immunity investigations of linear DC current regulators," in Proc. of the 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, Edinburgh, 2015, pp. 119-124. [CrossRef] [SCOPUS Times Cited 1] [10] Zh. Wang, Ch. Zhou, T. Liu, Sh. Zhao, and Zh. Liang, "Nonlinear behavior immunity modeling of an LDO voltage regulator under conducted EMI," IEEE Trans. Electromagn. Compat., vol. 58, no. 4, pp. 1016-1024, Aug. 2016. [CrossRef] [Web of Science Times Cited 14] [SCOPUS Times Cited 16] [11] A. Lavarda, D. Amschl, S. Bauer, B. Deutschmann, "Characterization of the immunity of integrated circuits (ICs) at wafer level," in Proc. the 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, Edinburgh, 2015, pp. 196-201. [CrossRef] [SCOPUS Times Cited 2] [12] T. Sawada, K. Yoshikawa, H. Takata, K. Nii, and M. Nagata, "An extended direct power injection method for in-place susceptibility characterization of VLSI circuits against electromagnetic interference," IEEE Trans. Very Large Scale Integr. (VLSI) Syst., vol. 23, no. 10, pp. 2347-2351, Oct. 2015. [CrossRef] [Web of Science Times Cited 3] [SCOPUS Times Cited 5] [13] K. Taniguchi et al., "Susceptibility evaluation of CAN transceiver circuits with in-place waveform capturing under RF DPI," in Proc. 11th International workshop on the Electromagnetic Compatibility of Integrated Circuits, 2017, pp. 59-63. [CrossRef] [SCOPUS Times Cited 5] [14] S. Dhia, A. Boyer, B. Vrignon, M. Deobarro, and T. V. Dinh, "On-Chip noise sensor for integrated circuit susceptibility investigations," IEEE Trans. Instrum. Meas., vol. 61, no. 3, pp. 696-707, 2012. [CrossRef] [Web of Science Times Cited 24] [SCOPUS Times Cited 33] [15] IEC 62132-4, Integrated circuits - measurement of electromagnetic immunity, 150 KHz to 1 GHz - part 4: direct RF power injection method, February, 2006. https://webstore.iec.ch/publication/6510 [16] L. Atias, A. Teman, and A. Fish, "Single event upset mitigation in low power SRAM design," in Proc. IEEE 28th Convention of Electrical and Electronics Engineers in Israel, Eilat, 2014, pp. 1-5. [CrossRef] [SCOPUS Times Cited 11] [17] David G. Mavis and Paul H. Eaton, "SEU and SET modeling and mitigation in deep submicron technologies," 45th Annual International Reliability Physics Symposium, Phoenix, 2007, pp. 293-305. [CrossRef] [Web of Science Times Cited 70] [SCOPUS Times Cited 109] [18] S. Kumar, S. Chellappa, and L. T. Clark, "Temporal pulse-clocked multi-bit flip-flop mitigating SET and SEU," in Proc. IEEE International Symposium on Circuits and Systems (ISCAS), Lisbon, 2015, pp. 814-817. [CrossRef] [SCOPUS Times Cited 18] [19] MACOM Division of AMP Inc., RF directional couplers and 3 dB hybrids, Application Note M560, Ver.2.00. [20] Agilent, 8648C Synthesized RF Signal Generator, 9 kHz to 3200 MHz. [21] Ophirrf, Linear Power RF Amplifier, model 5124. [22] Xilinx Inc., Spartan-3 FPGA Family Datasheet, June, 2013, pp. 63-65. Web of Science® Citations for all references: 458 TCR SCOPUS® Citations for all references: 654 TCR Web of Science® Average Citations per reference: 20 ACR SCOPUS® Average Citations per reference: 28 ACR TCR = Total Citations for References / ACR = Average Citations per Reference We introduced in 2010 - for the first time in scientific publishing, the term "References Weight", as a quantitative indication of the quality ... Read more Citations for references updated on 2024-12-01 05:29 in 118 seconds. Note1: Web of Science® is a registered trademark of Clarivate Analytics. Note2: SCOPUS® is a registered trademark of Elsevier B.V. Disclaimer: All queries to the respective databases were made by using the DOI record of every reference (where available). Due to technical problems beyond our control, the information is not always accurate. Please use the CrossRef link to visit the respective publisher site. |
Copyright ©2001-2024
Faculty of Electrical Engineering and Computer Science
Stefan cel Mare University of Suceava, Romania
All rights reserved: Advances in Electrical and Computer Engineering is a registered trademark of the Stefan cel Mare University of Suceava. No part of this publication may be reproduced, stored in a retrieval system, photocopied, recorded or archived, without the written permission from the Editor. When authors submit their papers for publication, they agree that the copyright for their article be transferred to the Faculty of Electrical Engineering and Computer Science, Stefan cel Mare University of Suceava, Romania, if and only if the articles are accepted for publication. The copyright covers the exclusive rights to reproduce and distribute the article, including reprints and translations.
Permission for other use: The copyright owner's consent does not extend to copying for general distribution, for promotion, for creating new works, or for resale. Specific written permission must be obtained from the Editor for such copying. Direct linking to files hosted on this website is strictly prohibited.
Disclaimer: Whilst every effort is made by the publishers and editorial board to see that no inaccurate or misleading data, opinions or statements appear in this journal, they wish to make it clear that all information and opinions formulated in the articles, as well as linguistic accuracy, are the sole responsibility of the author.
Faculty of Electrical Engineering and Computer Science
Stefan cel Mare University of Suceava, Romania
All rights reserved: Advances in Electrical and Computer Engineering is a registered trademark of the Stefan cel Mare University of Suceava. No part of this publication may be reproduced, stored in a retrieval system, photocopied, recorded or archived, without the written permission from the Editor. When authors submit their papers for publication, they agree that the copyright for their article be transferred to the Faculty of Electrical Engineering and Computer Science, Stefan cel Mare University of Suceava, Romania, if and only if the articles are accepted for publication. The copyright covers the exclusive rights to reproduce and distribute the article, including reprints and translations.
Permission for other use: The copyright owner's consent does not extend to copying for general distribution, for promotion, for creating new works, or for resale. Specific written permission must be obtained from the Editor for such copying. Direct linking to files hosted on this website is strictly prohibited.
Disclaimer: Whilst every effort is made by the publishers and editorial board to see that no inaccurate or misleading data, opinions or statements appear in this journal, they wish to make it clear that all information and opinions formulated in the articles, as well as linguistic accuracy, are the sole responsibility of the author.
