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Stefan cel Mare
University of Suceava
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Print ISSN: 1582-7445
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WorldCat: 643243560
doi: 10.4316/AECE


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  4/2014 - 1
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Stochastic Simulation of Integrated Circuits with Nonlinear Black-Box Components via Augmented Deterministic Equivalents

MANFREDI, P. See more information about MANFREDI, P. on SCOPUS See more information about MANFREDI, P. on IEEExplore See more information about MANFREDI, P. on Web of Science, STIEVANO, I. S. See more information about  STIEVANO, I. S. on SCOPUS See more information about  STIEVANO, I. S. on SCOPUS See more information about STIEVANO, I. S. on Web of Science, CANAVERO, F. G. See more information about CANAVERO, F. G. on SCOPUS See more information about CANAVERO, F. G. on SCOPUS See more information about CANAVERO, F. G. on Web of Science
 
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Download PDF pdficon (1,110 KB) | Citation | Downloads: 1,079 | Views: 3,015

Author keywords
circuit simulation, integrated circuits, nonlinear circuits, SPICE, statistical analysis

References keywords
stochastic(11), design(8), circuits(8), technology(7), polynomial(7), packaging(6), manufacturing(6), components(6), chaos(6), canavero(6)
Blue keywords are present in both the references section and the paper title.

About this article
Date of Publication: 2014-11-30
Volume 14, Issue 4, Year 2014, On page(s): 3 - 8
ISSN: 1582-7445, e-ISSN: 1844-7600
Digital Object Identifier: 10.4316/AECE.2014.04001
Web of Science Accession Number: 000348772500001
SCOPUS ID: 84921691268

Abstract
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This paper extends recent literature results concerning the statistical simulation of circuits affected by random electrical parameters by means of the polynomial chaos framework. With respect to previous implementations, based on the generation and simulation of augmented and deterministic circuit equivalents, the modeling is extended to generic and black-box multi-terminal nonlinear subcircuits describing complex devices, like those found in integrated circuits. Moreover, based on recently-published works in this field, a more effective approach to generate the deterministic circuit equivalents is implemented, thus yielding more compact and efficient models for nonlinear components. The approach is fully compatible with commercial (e.g., SPICE-type) circuit simulators and is thoroughly validated through the statistical analysis of a realistic interconnect structure with a 16-bit memory chip. The accuracy and the comparison against previous approaches are also carefully established.


References | Cited By  «-- Click to see who has cited this paper

[1] L. Scheffer, L. Lavagno, and G. Martin, EDA for IC Implementation, Circuit Design, and Process Technology. Boca Raton, FL: CRC Press, Taylor & Francis Group, 2006.

[2] T. Mikazuki and N. Matsui, "Statistical design techniques for high-speed circuit boards with correlated structure distributions," IEEE Transactions on Components, Packaging and Manufacturing Technology, Part A, vol. 17, no. 1, pp. 159-165, 1994,
[CrossRef] [Web of Science Record]


[3] R. Spence and R. S. Soin, Tolerance Design of Electronic Circuits. London: Imperial College Press, 1997.

[4] Q. Zhang, J. J. Liou, J. McMacken, J. Thomson, and P. Layman, "Development of robust interconnect model based on design of experiments and multiobjective optimization," IEEE Transactions on Electron Devices, vol. 48, no. 9, pp. 1885-1891, 2001,
[CrossRef] [SCOPUS Times Cited 50]


[5] A. H. Zaabab, Qi-Jun Zhang, and M. Nakhla, "A neural network modeling approach to circuit optimization and statistical design," IEEE Transactions on Microwave Theory and Techniques, vol. 43, no. 6, pp. 1349-1358, 1995,
[CrossRef] [Web of Science Times Cited 184] [SCOPUS Times Cited 227]


[6] L. Brancik and E. Kolarova, "Simulation of higher-order electrical circuits with stochastic parameters via SDEs," Advances in Electrical and Computer Engineering, vol. 13, no. 1, pp. 17-22, 2013,
[CrossRef] [Full Text] [Web of Science Times Cited 19] [SCOPUS Times Cited 23]


[7] L. Brancik and E. Kolarova, "Application of stochastic differential-algebraic equations in hybrid MTL systems analysis," Elektronika Ir Elektrotechnika, vol. 20, no. 5, pp. 41-45, 2014,
[CrossRef] [Web of Science Times Cited 13] [SCOPUS Times Cited 13]


[8] D. Xiu, "Fast numerical methods for stochastic computations: a review," Communications in Computational Physics, vol. 5, no. 2-4, pp. 242-272, 2009.

[9] Q. Su and K. Strunz, "Stochastic circuit modelling with Hermite polynomial chaos," IET Electronics Letters, vol. 41, no. 21, pp. 1163-1165, 2005,
[CrossRef] [Web of Science Times Cited 23] [SCOPUS Times Cited 29]


[10] K. Strunz and Q. Su, "Stochastic formulation of SPICE-type electronic circuit simulation using polynomial chaos," ACM Transactions on Modeling and Computer Simulation, vol. 18, no. 4, pp. 15:1-15:23, 2008,
[CrossRef] [Web of Science Times Cited 61] [SCOPUS Times Cited 66]


[11] N. Mi, S. X.-D. Tan, Y. Cai, and X. Hong, "Fast variational analysis of on-chip power grids by stochastic extended Krylov subspace method," IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 27, no. 11, pp. 1996-2006, 2008,
[CrossRef] [Web of Science Times Cited 19] [SCOPUS Times Cited 20]


[12] S. Vrudhula, J. M. Wang, and P. Ghanta, "Hermite polynomial based interconnect analysis in the presence of process variations," IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 25, no. 10, pp. 2001-2011, 2006,
[CrossRef] [Web of Science Times Cited 59] [SCOPUS Times Cited 74]


[13] I. S. Stievano, P. Manfredi, and F. G. Canavero, "Parameters variability effects on multiconductor interconnects via Hermite polynomial chaos," IEEE Transactions on Components, Packaging and Manufacturing Technology, vol. 1, no. 8, pp. 1234-1239, 2011,
[CrossRef] [Web of Science Times Cited 76] [SCOPUS Times Cited 88]


[14] D. Vande Ginste, D. De Zutter, D. Deschrijver, T. Dhaene, P. Manfredi, and F. Canavero, "Stochastic modeling-based variability analysis of on-chip interconnects," IEEE Transactions on Components, Packaging and Manufacturing Technology, vol. 2, no. 7, pp. 1182-1192, 2012,
[CrossRef] [Web of Science Times Cited 76] [SCOPUS Times Cited 86]


[15] P. Manfredi, D. Vande Ginste, D. De Zutter, and F. G. Canavero, "Uncertainty assessment of lossy and dispersive lines in SPICE-type environments," IEEE Transactions on Components, Packaging and Manufacturing Technology, vol. 3, no. 7, pp. 1252-1258, 2013,
[CrossRef] [Web of Science Times Cited 44] [SCOPUS Times Cited 47]


[16] R. G. Ghanem and P. D. Spanos, Stochastic Finite Elements. A Spectral Approach. New York: Springer-Verlag, 1991.

[17] A. Biondi, D. Vande Ginste, D. De Zutter, P. Manfredi, and F. G. Canavero, "Variability analysis of interconnects terminated by general nonlinear loads," IEEE Transactions on Components, Packaging and Manufacturing Technology, vol. 3, no. 7, pp. 1244-1251, 2013,
[CrossRef] [Web of Science Times Cited 32] [SCOPUS Times Cited 35]


[18] Z. Zhang, T. A. El-Moselhy, I. M. Elfadel, and L. Daniel, "Stochastic testing method for transistor-level uncertainty quantification based on generalized polynomial chaos," IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 32, no. 10, pp. 1533-1545, 2013,
[CrossRef] [Web of Science Times Cited 115] [SCOPUS Times Cited 129]


[19] M. R. Rufuie, E. Gad, M. Nakhla, and R. Achar, "Generalized Hermite polynomial chaos for variability analysis of macromodels embedded in nonlinear circuits," IEEE Transactions on Components, Packaging and Manufacturing Technology, vol. 4, no. 4, pp. 673-684, 2014,
[CrossRef] [Web of Science Times Cited 50] [SCOPUS Times Cited 55]


[20] P. Manfredi, D. Vande Ginste, D. De Zutter, and F. G. Canavero, "Stochastic modeling of nonlinear circuits via SPICE-compatible spectral equivalents," IEEE Transactions on Circuits and Systems I: Regular Papers, vol. 61, no. 7, pp. 2057-2065, 2014,
[CrossRef] [Web of Science Times Cited 43] [SCOPUS Times Cited 48]


[21] I. S. Stievano, L. Rigazio, F. G. Canavero, T. R. Cunha, J. C. Pedro, H. M. Teixeira, A. Girardi, R. Izzi, and F. Vitale, "Behavioral modeling of IC memories from measured data," IEEE Transactions on Instrumentation and Measurement, vol. 60, no. 10, pp. 3471-3479, 2011,
[CrossRef] [Web of Science Times Cited 6] [SCOPUS Times Cited 7]


[22] D. Xiu and G. E. Karniadakis, "The Wiener-Askey polynomial chaos for stochastic differential equations," SIAM Journal on Scientific Computing, vol. 24, no. 2, pp. 619-622, 2002,
[CrossRef] [Web of Science Times Cited 2744] [SCOPUS Times Cited 3268]


[23] HSPICE User Guide, Version B-2008.09, Synopsys, Inc., Mountain View, CA, USA, 2008.



References Weight

Web of Science® Citations for all references: 3,564 TCR
SCOPUS® Citations for all references: 4,265 TCR

Web of Science® Average Citations per reference: 149 ACR
SCOPUS® Average Citations per reference: 178 ACR

TCR = Total Citations for References / ACR = Average Citations per Reference

We introduced in 2010 - for the first time in scientific publishing, the term "References Weight", as a quantitative indication of the quality ... Read more

Citations for references updated on 2021-11-27 03:58 in 115 seconds.




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