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Stefan cel Mare
University of Suceava
Faculty of Electrical Engineering and
Computer Science
13, Universitatii Street
Suceava - 720229

Print ISSN: 1582-7445
Online ISSN: 1844-7600
WorldCat: 643243560
doi: 10.4316/AECE


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  3/2019 - 9

Tuning Logic Simulator for Estimation of VLSI Timing Degradation under Aging

MILIC, M. See more information about MILIC, M. on SCOPUS See more information about MILIC, M. on IEEExplore See more information about MILIC, M. on Web of Science
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Download PDF pdficon (322 KB) | Citation | Downloads: 379 | Views: 1,263

Author keywords
accelerated aging, circuit simulation, integrated circuit modeling, integrated circuit reliability, very large integration

References keywords
reliability(12), aging(10), design(9), analysis(8), timing(7), circuits(7), statistical(5), microelectronics(5), jmicrorel(5), vlsi(4)
Blue keywords are present in both the references section and the paper title.

About this article
Date of Publication: 2019-08-31
Volume 19, Issue 3, Year 2019, On page(s): 75 - 82
ISSN: 1582-7445, e-ISSN: 1844-7600
Digital Object Identifier: 10.4316/AECE.2019.03009
Web of Science Accession Number: 000486574100009
SCOPUS ID: 85072177529

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The importance of aging effects analysis in VLSI circuits increases with nowadays fast scaling of integrated circuits manufacturing technologies. Delays along paths in a digital circuit are crucial parameters that define the circuit working frequency. They degrade over time resulting in delay faults and circuit failures. The prediction of circuit long-term behavior is useful mechanism for ensuring a VLSI's lifetime reliability. In particular, paths in a digital circuit that have the largest delays are the most sensitive to gates' delay fluctuations, and consequently aging. Delay of those paths can be obtained using either aging sensors or through statistical analysis of accelerated aging experiments, but such approaches can be very difficult, time consuming and expensive for implementation. This paper suggests a new methodology capable to estimate the aging effect to digital circuit delays along multiple paths, simultaneously. The proposed technique has been developed for circuits described at a gate level, and implemented within a standard logic simulator, which enables aging analysis in initial phases of system design process. Results show that proposed methodology can efficiently estimate the long-term timing behavior of the digital circuit in a very early design stages with a small computational effort, helping the designer in selection of most reliable design choices.

References | Cited By  «-- Click to see who has cited this paper

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References Weight

Web of Science® Citations for all references: 260 TCR
SCOPUS® Citations for all references: 419 TCR

Web of Science® Average Citations per reference: 10 ACR
SCOPUS® Average Citations per reference: 16 ACR

TCR = Total Citations for References / ACR = Average Citations per Reference

We introduced in 2010 - for the first time in scientific publishing, the term "References Weight", as a quantitative indication of the quality ... Read more

Citations for references updated on 2021-11-25 16:39 in 124 seconds.

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