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Stefan cel Mare
University of Suceava
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Print ISSN: 1582-7445
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WorldCat: 643243560
doi: 10.4316/AECE


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  1/2020 - 3

Visualizing Imitation of Typical Intense X-ray Radiation Processes

LIU, H. See more information about LIU, H. on SCOPUS See more information about LIU, H. on IEEExplore See more information about LIU, H. on Web of Science, YANG, S. See more information about YANG, S. on SCOPUS See more information about YANG, S. on SCOPUS See more information about YANG, S. on Web of Science
 
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Download PDF pdficon (485 KB) | Citation | Downloads: 372 | Views: 830

Author keywords
visualization, radiation imaging, X-rays, computer simulation, radiation effects

References keywords
pinch(6), image(6), array(6), radiation(5), plasma(5), nucl(5), imaging(5), sensors(4), pinches(4)
Blue keywords are present in both the references section and the paper title.

About this article
Date of Publication: 2020-02-28
Volume 20, Issue 1, Year 2020, On page(s): 19 - 26
ISSN: 1582-7445, e-ISSN: 1844-7600
Digital Object Identifier: 10.4316/AECE.2020.01003
Web of Science Accession Number: 000518392600003
SCOPUS ID: 85083719664

Abstract
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A visualizing imitation system of typical intense X-ray radiation process which uses the Light Emitting Diode (LED) light source, the Liquid Crystal Display (LCD) panel, and the Charge Coupled Device (CCD) camera is proposed. Both the radiation processes of spot and wire array are investigated. First, two imitation devices are developed. A LED light producer is designed to imitate the spot source. A microcontroller is utilized for its output control. A LCD panel and a raspberry pi circuit are employed for the radiation imitation of wire array. Second, two radiation imitation methods are proposed. An exponential attenuation function and a particle system-based simulation are proposed. Third, a CCD camera is used to observe the imitation devices above, and many image datasets can be created. Because the shutter response speed of normal camera cannot reach to the change speed of the actual radiation source, a time-lapse capture technique is developed. Finally, some image features, including the statistic and the geometric metrics, are computed to evaluate the imitation effect. Many experiment results have shown the effectiveness of propose method. This system can help radiation researcher understand the transient radiation processes and study the initial image processing algorithms for them to some extent.


References | Cited By  «-- Click to see who has cited this paper

[1] G. L. Morgan, R. R. Berggren, P. A. Bradley, F. H. Cverna, J. R. Faulkner, P. L. Gobby, J. A. Oertel, F. J. Swenson, J. A. Tegtmeier, R. B. Walton, M. D. Wilke, D. C. Wilson, L. Disdier, "Development of a neutron imaging diagnostic for inertial confinement fusion experiments," Rev. Sci. Instrum., vol. 72, no. 1, pp. 865-868, Jan. 2001.
[CrossRef] [Web of Science Times Cited 31] [SCOPUS Times Cited 35]


[2] C. P. Salomon, C. Ferreira, G. Lambert-Torres, C. E. Teixeira, L. E. B. D. Silva, W. C. Santana, E. L. Bonaldi, L. E. D. L. D. Oliveira, "Electrical signature analysis for condition monitoring of permanent magnet synchronous machine," Adv. Electr. Comput. En., vol. 18, no. 4, pp. 91-98, Nov. 2018.
[CrossRef] [Full Text] [Web of Science Times Cited 3] [SCOPUS Times Cited 5]


[3] X. Yu , J. Shen , M. Qu , W. Liu , H. Zhong , H. Zhang, S. Yan, G. Zhang, X. Le, "Infrared imaging diagnostics for intense pulsed electron beam," Rev. Sci. Instrum., vol. 86, no. 8, pp. 083305-1-083305-7, Jul. 2015.
[CrossRef] [Web of Science Times Cited 11] [SCOPUS Times Cited 11]


[4] Y. Xue, Z. Wang, B. He, Z. Yao, M. Liu, W. Ma, J. Sheng, G. Dong, J. Jin, "Theoretical and experimental study of the dark signal in CMOS image sensors affected by neutron from a nuclear reactor," AIP Adv., vol. 7, no. 12, pp. 125222-1-125222-9, Dec. 2017.
[CrossRef] [Web of Science Times Cited 2] [SCOPUS Times Cited 3]


[5] Y. Sato, Y. Tanifuji, Y. Terasaka, H. Usami, M. Kaburagi, K. Kawabata, W. Utsugi, H. Kikuchi, S. Takahira, T. Torii, "Radiation imaging using a compact Compton camera inside the Fukushima Daiichi nuclear power station building," J. Nucl. Sci. Technol., vol. 55, no. 9, pp. 1-6, May 2018.
[CrossRef] [Web of Science Times Cited 15] [SCOPUS Times Cited 23]


[6] V. Goiffon, M. Estribeau, P. Cervantes, R. Molina, M. Gaillardin, P. Magnan, "Influence of transfer gate design and bias on the radiation hardness of pinned photodiode CMOS image sensors," IEEE Trans. Nucl. Sci., vol. 61, no. 6, pp. 3290-3301, Dec. 2014.
[CrossRef] [Web of Science Times Cited 26] [SCOPUS Times Cited 28]


[7] B. Jones, C. Deeney, C. A. Coverdale, C. J. Meyer, and P. D. LePell, "Monochromatic X-ray self-emission imaging of imploding wire array Z-pinches on the Z accelerator," IEEE Trans. Plasma Sci., vol. 34, no. 2, pp. 213-222, Apr. 2006.
[CrossRef] [Web of Science Times Cited 14] [SCOPUS Times Cited 17]


[8] A. D. Blas, J. Toral, C. Tapia, "Equipment for the continuous measurement and identification of Gamma radioactivity on aerosols," IEEE Trans. Nucl. Sci., vol. 63, no. 3, pp. 1526-1530, Jun. 2016.
[CrossRef] [Web of Science Times Cited 1] [SCOPUS Times Cited 1]


[9] R. M. Cibils, "Sensitivity enhancement in radiation portal monitoring using adaptive matched filtering," IEEE Trans. Nucl. Sci., vol. 63, no. 2, pp. 1162-1168, Apr. 2016.
[CrossRef] [Web of Science Times Cited 2] [SCOPUS Times Cited 2]


[10] G. Bellotti, A. D. Butt, M. Carminati, C. Fiorini, L. Bombelli, G. Borghi, C. Piemonte, N. Zorzi, and A. Balerna, "ARDESIA detection module: a four-channel array of SDDs for Mcps X-Ray spectroscopy in synchrotron radiation applications," IEEE Trans. Nucl. Sci., vol. 65, no. 7, pp.1355-1364, Jul. 2018.
[CrossRef] [Web of Science Times Cited 15] [SCOPUS Times Cited 16]


[11] S. V. Lebedev, R. Aliaga-Rossel, S. N. Bland, J. P. Chittenden, A. E. Dangor, M. G. Haines, and I. H. Mitchell, "The dynamics of wire array Z-pinch implosions," Phys. Plasmas, vol. 6, no. 5, pp. 2016-2022, Nov. 1998.
[CrossRef] [Web of Science Times Cited 108] [SCOPUS Times Cited 116]


[12] S. V. Lebedev, F. N. Beg, S. N. Bland, J. P. Chittenden, A. E. Dangor, M. G. Haines, K. H. Kwek, S. A. Pikuz, T. A. Shelkovenko, "Effect of discrete wires on the implosion dynamics of wire arrays Z pinches," Phys. Plasmas, vol. 8, no. 8, pp. 3734-3747, Apr. 2001.
[CrossRef] [Web of Science Times Cited 292] [SCOPUS Times Cited 308]


[13] J. P. Chittenden, S. V. Lebedev, S. N. Bland, F. N. Beg, M .G. Haines, "One-, two- and three-dimensional modeling of the different phases of wire array Z-pinch evolution," Phys. Plasmas, vol. 8, no. 5, pp. 2305-2314, Dec. 2000.
[CrossRef] [Web of Science Times Cited 57] [SCOPUS Times Cited 72]


[14] D. B. Sinars, "Advances in compact wire-array Z-pinch X-ray sources and Z-pinch diagnostics," In Proc. IEEE Int. Conf. Plasma Sci, Traverse City, MI, USA, 4-8 Jun. 2006, pp. 474.
[CrossRef]


[15] M. Rezaei, and P. Franti, "Real-time clustering of large Geo-referenced data for visualizing on map," Adv. Electr. Comput. En., vol. 18, no. 4, pp. 63-74, Nov. 2018.
[CrossRef] [Full Text] [Web of Science Times Cited 2] [SCOPUS Times Cited 4]


[16] F. Zhang, and H. Niu, "A 75-ps gated CMOS image sensor with low parasitic light sensitivity," Sensors, vol. 16, no. 7, pp. 999-1-999-10, Jun. 2016.
[CrossRef] [Web of Science Times Cited 4] [SCOPUS Times Cited 4]


[17] R. Zhang, C. Mao, K. Huang, X. Zou, and X. Wang, "Comparison of nonuniform transmission lines with Gaussian and exponential impedance profiles for Z-pinch," IEEE Trans. Plasma Sci., vol. 40, no. 12, pp. 3395-3398, Dec. 2012.
[CrossRef] [Web of Science Times Cited 14] [SCOPUS Times Cited 21]


[18] G. F. Knoll, Radiation Detection and Measurement. Wiley & Sons, New York, pp. 103-119, 1988.

[19] W. T. Reeves, "Particle systems - a technique for modeling a class of fuzzy objects," Comput. Graph., vol. 17, no. 3, pp. 359-375, Jan. 1983.
[CrossRef] [Web of Science Times Cited 336] [SCOPUS Times Cited 439]


[20] R. Bridson, J. Hourihan, and M. Nordenstam, "Curl-noise for procedural fluid flow," ACM Trans. Graph., vol. 26, no. 99, pp. 46-1-46-3, Jul. 2007.
[CrossRef]


[21] W. Dong, X. Zhang, and C. Zhang, "Generation of cloud image based on Perlin noise," In Proc. IEEE Int. Conf. Multimedia Communications, Hong Kong, China, 2010, pp. 61-63.
[CrossRef] [SCOPUS Times Cited 7]


[22] J. H. Xue, D. M. Titterington, "t-tests, F-tests and Otsu's methods for image thresholding," IEEE Trans. Image Process., vol. 20, no. 8, pp. 2392-2396, Aug. 2011.
[CrossRef] [Web of Science Times Cited 46] [SCOPUS Times Cited 57]


[23] H. Liu, F. Li, H. Lu, "Imaging air quality evaluation using definition metrics and detrended fluctuation analysis," In Proc. IEEE Int. Conf. Signal Process., Beijing, China, 2010, pp. 968-971.
[CrossRef] [SCOPUS Times Cited 6]


[24] X. Zhang, J. Cui, W. Wang, C. Lin, "A study for texture feature extraction of high-resolution satellite images based on a direction measure and gray level co-occurrence matrix fusion algorithm," Sensors, vol. 17, no. 7, pp. 1474-1-1474-15, Jun. 2017.
[CrossRef] [Web of Science Times Cited 25] [SCOPUS Times Cited 104]


[25] T. Zhao, X. Zou, X. Wang, Y. Zhao, Y. Du, R. Zhang, and R. Liu, "X-ray backlighting of developments of X-pinches and wire-array z-pinches using an X-pinch," IEEE Trans. Plasma Sci., vol. 38, no. 4, pp. 646-651, Apr. 2010.
[CrossRef] [Web of Science Times Cited 22] [SCOPUS Times Cited 30]




References Weight

Web of Science® Citations for all references: 1,026 TCR
SCOPUS® Citations for all references: 1,309 TCR

Web of Science® Average Citations per reference: 39 ACR
SCOPUS® Average Citations per reference: 50 ACR

TCR = Total Citations for References / ACR = Average Citations per Reference

We introduced in 2010 - for the first time in scientific publishing, the term "References Weight", as a quantitative indication of the quality ... Read more

Citations for references updated on 2021-11-23 03:48 in 144 seconds.




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Stefan cel Mare University of Suceava, Romania


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