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JCR Impact Factor: 0.700
JCR 5-Year IF: 0.700
SCOPUS CiteScore: 1.8
Issues per year: 4
Current issue: Aug 2024
Next issue: Nov 2024
Avg review time: 57 days
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PUBLISHER

Stefan cel Mare
University of Suceava
Faculty of Electrical Engineering and
Computer Science
13, Universitatii Street
Suceava - 720229
ROMANIA

Print ISSN: 1582-7445
Online ISSN: 1844-7600
WorldCat: 643243560
doi: 10.4316/AECE


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2024-Jun-20
Clarivate Analytics published the InCites Journal Citations Report for 2023. The InCites JCR Impact Factor of Advances in Electrical and Computer Engineering is 0.700 (0.700 without Journal self-cites), and the InCites JCR 5-Year Impact Factor is 0.600.

2023-Jun-28
Clarivate Analytics published the InCites Journal Citations Report for 2022. The InCites JCR Impact Factor of Advances in Electrical and Computer Engineering is 0.800 (0.700 without Journal self-cites), and the InCites JCR 5-Year Impact Factor is 1.000.

2023-Jun-05
SCOPUS published the CiteScore for 2022, computed by using an improved methodology, counting the citations received in 2019-2022 and dividing the sum by the number of papers published in the same time frame. The CiteScore of Advances in Electrical and Computer Engineering for 2022 is 2.0. For "General Computer Science" we rank #134/233 and for "Electrical and Electronic Engineering" we rank #478/738.

2022-Jun-28
Clarivate Analytics published the InCites Journal Citations Report for 2021. The InCites JCR Impact Factor of Advances in Electrical and Computer Engineering is 0.825 (0.722 without Journal self-cites), and the InCites JCR 5-Year Impact Factor is 0.752.

2022-Jun-16
SCOPUS published the CiteScore for 2021, computed by using an improved methodology, counting the citations received in 2018-2021 and dividing the sum by the number of papers published in the same time frame. The CiteScore of Advances in Electrical and Computer Engineering for 2021 is 2.5, the same as for 2020 but better than all our previous results.

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  1/2020 - 3

Visualizing Imitation of Typical Intense X-ray Radiation Processes

LIU, H. See more information about LIU, H. on SCOPUS See more information about LIU, H. on IEEExplore See more information about LIU, H. on Web of Science, YANG, S. See more information about YANG, S. on SCOPUS See more information about YANG, S. on SCOPUS See more information about YANG, S. on Web of Science
 
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Download PDF pdficon (485 KB) | Citation | Downloads: 829 | Views: 2,384

Author keywords
visualization, radiation imaging, X-rays, computer simulation, radiation effects

References keywords
pinch(6), image(6), array(6), radiation(5), plasma(5), nucl(5), imaging(5), sensors(4), pinches(4)
Blue keywords are present in both the references section and the paper title.

About this article
Date of Publication: 2020-02-28
Volume 20, Issue 1, Year 2020, On page(s): 19 - 26
ISSN: 1582-7445, e-ISSN: 1844-7600
Digital Object Identifier: 10.4316/AECE.2020.01003
Web of Science Accession Number: 000518392600003
SCOPUS ID: 85083719664

Abstract
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A visualizing imitation system of typical intense X-ray radiation process which uses the Light Emitting Diode (LED) light source, the Liquid Crystal Display (LCD) panel, and the Charge Coupled Device (CCD) camera is proposed. Both the radiation processes of spot and wire array are investigated. First, two imitation devices are developed. A LED light producer is designed to imitate the spot source. A microcontroller is utilized for its output control. A LCD panel and a raspberry pi circuit are employed for the radiation imitation of wire array. Second, two radiation imitation methods are proposed. An exponential attenuation function and a particle system-based simulation are proposed. Third, a CCD camera is used to observe the imitation devices above, and many image datasets can be created. Because the shutter response speed of normal camera cannot reach to the change speed of the actual radiation source, a time-lapse capture technique is developed. Finally, some image features, including the statistic and the geometric metrics, are computed to evaluate the imitation effect. Many experiment results have shown the effectiveness of propose method. This system can help radiation researcher understand the transient radiation processes and study the initial image processing algorithms for them to some extent.


References | Cited By

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Cited-By SCOPUS

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Cited-By CrossRef

[1] Development of a Picosecond Ultraviolet Light Source for Transient Radiation Time Response Testing of High-speed Cameras, Wang, Lirong, Zhang, Ling, Feng, Jingcheng, Liu, Haoting, Li, Haiguang, Guo, Zhenhui, Zhao, Hui, Li, Qing, Zhang, Guochun, Proceedings of the 2024 3rd International Symposium on Intelligent Unmanned Systems and Artificial Intelligence, ISBN 9798400710025, 2024.
Digital Object Identifier: 10.1145/3669721.3670855
[CrossRef]

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Faculty of Electrical Engineering and Computer Science
Stefan cel Mare University of Suceava, Romania


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